CMOS Standard Cells Characterization for Defect Based Testing

This paper extends the CMOS standard cells characterization methodology for defect based testing. The proposed methodology allows to find the types of faults which may occur in a real IC, to determine their probabilities, and to find the input test vectors which detect these faults. For shorts at the inputs two types of cell simulation conditions – “Wired-AND” and “Wired-OR” – are used. Examples of industrial standard cells characterization indicate that a single logic fault probability table is not sufficient. Separate tables for “Wired-AND” and “WiredOR” conditions at the inputs are needed for full characterization and hierarchical test generation.